1. Deep-Level Effects in GaAs Microelectronics: A Review

   • N. P. Khuchua
   • L. V. Khvedelidze
   • I. F. Kodzhespirova

   OriginalPaper Pages: 257 - 274

2. Phase Formation in a Ta–Ni–N Thin Film during Its Electron-Beam Evaporation Deposition on a Heated Si(100) Substrate

   • A. G. Vasiliev
   • A. L. Vasiliev
   • M. Eindou

   OriginalPaper Pages: 275 - 281

3. Novel Ion-Lens Configurations: A Further Step to 2-nm Ion-Beam Lithography

   • V. A. Zhukov
   • M. M. Nesterov

   OriginalPaper Pages: 282 - 287

4. Stationary High-Field Domain in Si : Zn at the Excitation Threshold of Recombination Waves

   • A. V. Gostev
   • B. V. Kornilov
   • E. I. Rau

   OriginalPaper Pages: 288 - 291

5. Comparative Study of an RF and a Microwave High-Density-Plasma Source for Plasma Immersion Ion Implantation

   • S. N. Averkin
   • A. P. Ershov
   • Ya. N. Sukhanov

   OriginalPaper Pages: 292 - 300

6. Chaotic Solid-State Oscillators of High Spectral Stability with a Wideband Negative-Differential-Resistance Subsystem

   • V. G. Prokopenko

   OriginalPaper Pages: 301 - 306

7. Transient Analysis of Shielded On-Chip Interconnections

   • V. A. Goryachev
   • S. M. Zakharov

   OriginalPaper Pages: 307 - 314

8. Incoming Control of Solid-State Parts: A Review

   • M. I. Gorlov
   • A. V. Andreev

   OriginalPaper Pages: 315 - 321