Deep-Level Effects in GaAs Microelectronics: A Review N. P. KhuchuaL. V. KhvedelidzeI. F. Kodzhespirova OriginalPaper Pages: 257 - 274
Phase Formation in a Ta–Ni–N Thin Film during Its Electron-Beam Evaporation Deposition on a Heated Si(100) Substrate A. G. VasilievA. L. VasilievM. Eindou OriginalPaper Pages: 275 - 281
Novel Ion-Lens Configurations: A Further Step to 2-nm Ion-Beam Lithography V. A. ZhukovM. M. Nesterov OriginalPaper Pages: 282 - 287
Stationary High-Field Domain in Si : Zn at the Excitation Threshold of Recombination Waves A. V. GostevB. V. KornilovE. I. Rau OriginalPaper Pages: 288 - 291
Comparative Study of an RF and a Microwave High-Density-Plasma Source for Plasma Immersion Ion Implantation S. N. AverkinA. P. ErshovYa. N. Sukhanov OriginalPaper Pages: 292 - 300
Chaotic Solid-State Oscillators of High Spectral Stability with a Wideband Negative-Differential-Resistance Subsystem V. G. Prokopenko OriginalPaper Pages: 301 - 306
Transient Analysis of Shielded On-Chip Interconnections V. A. GoryachevS. M. Zakharov OriginalPaper Pages: 307 - 314
Incoming Control of Solid-State Parts: A Review M. I. GorlovA. V. Andreev OriginalPaper Pages: 315 - 321
