Self-aligned Technology Applied to Planar Power MOSFETs M. A. KorolevA. V. ShvetsR. D. Tikhonov OriginalPaper Pages: 11 - 13
MBE-Grown GaAs Films on GaAs(111)A Substrates Misoriented toward [21¯1¯] G. B. Galiev OriginalPaper Pages: 14 - 20
Methods for the Prediction of Total-Dose Effects on Modern Integrated Semiconductor Devices in Space: A Review V. V. BelyakovV. S. PershenkovP. K. Skorobogatov OriginalPaper Pages: 25 - 39
Statistical Simulation for Process Design and Optimization in IC Manufacture A. A. KouleshoffV. S. MalyshevV. R. Stempitsky OriginalPaper Pages: 39 - 50
Statistical Yield Modeling for IC Manufacture: Hierarchical Fault Distributions Yu. I. BogdanovN. A. BogdanovaV. L. Dshkhunyan OriginalPaper Pages: 51 - 62