X-ray and UV Adjustment of Threshold Voltage in MOS-Circuit Manufacture M. N. LevinV. R. GitlinS. G. Kadmensky OriginalPaper Pages: 346 - 350
Mid- and Long-Wave IR Detectors Using an Hg1 – xCdxTe Heteroepitaxial Layer V. V. VasilyevA. G. GolenkovN. Kh. Talipov OriginalPaper Pages: 351 - 358
Microelectromechanical System for Controlling Flow Past an Airfoil: Pressure Transducers A. A. TaskinB. I. FominV. V. Kozlov OriginalPaper Pages: 359 - 365
Modeling the High-Voltage Gas-Discharge-Plasma Etching of SiO2 V. A. Kolpakov OriginalPaper Pages: 366 - 374
Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers T. M. AgakhanyanA. Y. Nikiforov OriginalPaper Pages: 375 - 383
Non-Archimedean Calculus in the Mathematical Modeling of Digital ICs E. G. ShcheglovP. A. Arutyunov OriginalPaper Pages: 384 - 395
Digital-Reflectometry Characterization of the Surface Structure and Protective Property of Thin Films V. A. Kotenev OriginalPaper Pages: 396 - 406