Forecasting error distributions for means of measurement A. É. Fridman General Aspects of Metrology and Measurement Engineering Pages: 487 - 489
Nonlinear discrete-time signal processing in devices for the estimation, filtering, and demodulation of measurement data messages A. F. FominO. N. Novoselov General Aspects of Metrology and Measurement Engineering Pages: 489 - 495
Integrated-circuit ADC in an angular-displacement sensor for a sine-cosine rotating transformer Ya. M. Velikson General Aspects of Metrology and Measurement Engineering Pages: 495 - 499
Identifying variable-pressure sensors E. E. Bagdat'evA. A. Efimova General Aspects of Metrology and Measurement Engineering Pages: 499 - 501
Miniature photoelectric angle digitizer V. G. DomrachevA. P. Chibukhchyan General Aspects of Metrology and Measurement Engineering Pages: 501 - 505
Displacement digitizers based on multicomponent photoresistors V. B. BogdanovichA. L. PalamarchukS. V. Svechnikov General Aspects of Metrology and Measurement Engineering Pages: 505 - 507
Errors introduced by an optical Fourier processor in a laser diffractometer for small linear dimensions V. A. Tarlykov Linear and Angular Measurements Pages: 508 - 510
Checking and sorting components in an automatic production cell V. F. EfimovaV. N. Spiridonov Linear and Angular Measurements Pages: 511 - 513
Measuring the dispersion characteristics of fiber light-guides S. V. TikhomirovT. N. Khleskova Opticophysical Measurements Pages: 514 - 524
Theoretical sensitivity study of a wide-aperture power-measuring facility for the power of laser radiation R. R. Shurgaya Opticophysical Measurements Pages: 524 - 530
Measurement of nonlinearity in optical radiation detectors by light addition V. A. ShanginI. I. Yankeleva Opticophysical Measurements Pages: 530 - 533
Micropower operation as the basis for improving electronic measuring instruments Ya. T. Zagorskii Opticophysical Measurements Pages: 533 - 536
Spectral corrections to optical-density measurements V. A. BogachkinP. P. VtulkinG. N. Pavlygin Opticophysical Measurements Pages: 540 - 544
Optical shutter with a controllable exposure time V. M. KonobeevYa. T. ZagorskiiM. V. Ulanovskii Opticophysical Measurements Pages: 544 - 547
Optimal fields of use for bipolar and field-effect transistors in low-noise efficient amplifiers Ya. T. Zagorskii Opticophysical Measurements Pages: 547 - 551
Highly accurate contactless radio-wave level meter V. P. MarfinA. I. KiyashevV. P. Meshcheryakov Mechanical Measurements Pages: 552 - 556
Thermal-conductivity standards (organic liquids) L. N. NovichenokV. A. MarshakS. E. Man'kovetskaya Thermophysical Measurements Pages: 559 - 561
Birefringence errors in magnetooptical high-current converters V. B. Arkhangel'skiiS. F. GlagolevM. M. Chervinskii Measurement of Electric and Magnetic Quantities Pages: 562 - 565
Instrumental errors in time interval measurements by difference-period quantization V. E. Tyrsa Measurement of Electric and Magnetic Quantities Pages: 565 - 568
Pulsed spectrum generators with current break-off and differentiation as a measure of spectral density L. A. Pereverzev Measurement of Electric and Magnetic Quantities Pages: 568 - 572
Checking parameters of foil resistors N. N. Glukhov Measurement of Electric and Magnetic Quantities Pages: 572 - 574
Automatic measurement of noise immunity and electromagnetic compatibility of nonlinear microwave devices E. A. EgorovV. I. Pyataev Measurement of Electric and Magnetic Quantities Pages: 574 - 578
Classifying and standardizing the parameters of industrial refractometers M. A. Karabegov Physicochemical Measurements Pages: 579 - 581
Wide-range meter for measuring average particle sizes in emulsions and suspensions A. A. Rokhlenko Physicochemical Measurements Pages: 581 - 584
