Evaluation of the precision of the polished metal surface of a high-precision linear measure G. -L. B. LazenasN. V. ZhutautasF. A. Ponomarev Linear and Angular Measurements Pages: 1 - 2
High-speed digital micrometer with time conversion K. S. PolulyakhL. G. TemnikM. V. Krivogin Linear and Angular Measurements Pages: 8 - 11
Effect of humidity on double knife-edge balance readings V. A. BaranovP. I. Suzdaleva Mass Measurements Pages: 12 - 14
Using the Fabry-Perot reflecting interferometer for measuring laser wavelengths V. I. Bobrik Opticophysical Measurements Pages: 15 - 17
Cathode grid parameters of electron-optical converters V. A. MillerB. D. SmolkinB. M. Stepanov Opticophysical Measurements Pages: 18 - 20
New working standard of the temperature unit B. N. OleinikI. I. KirenkovB. P. Pavlov Thermophysical Measurements Pages: 21 - 24
Rapid method for measuring the heat capacity of solids V. I. TagirovN. F. GakhramanovM. D. Khomutova Thermophysical Measurements Pages: 24 - 27
Reference material for the thermodynamic properties of salts K. Z. Gomel'skiiV. F. LugininaV. N. Sennikova Thermophysical Measurements Pages: 27 - 29
Digital resistance comparators G. V. MiroshnikovYu. I. UshakovV. P. Shigorin Measurement of Electrical and Magnetic Quantities Pages: 30 - 32
Verification of automatic potentiometers and bridges A. I. Lisenkov Measurement of Electrical and Magnetic Quantities Pages: 32 - 36
Systematic error in the measurement of complex quantities G. V. Frolov Measurement of Electrical and Magnetic Quantities Pages: 37 - 40
Extending the domain of probe measurement of electrostatic-field parameters S. A. ChugunovV. M. Yurkevich Measurement of Electrical and Magnetic Quantities Pages: 40 - 43
Noncontacting measurement of electrical conductivity of cylindrical products V. I. BondarenkoV. P. SebkoV. I. Tyupa Measurement of Electrical and Magnetic Quantities Pages: 44 - 47
Zero drift of charge-to-voltage converter B. N. Suliz Measurement of Electrical and Magnetic Quantities Pages: 47 - 49
Two-channel wide-range amplitude-phase meter I. A. KrivosheevV. I. Panin Measurement of Electrical and Magnetic Quantities Pages: 50 - 51
Method for extending the frequency range of phase meters with discrete orthogonal processing M. K. Chmykh Measurement of Electrical and Magnetic Quantities Pages: 52 - 56
Testing converting devices by the current they consume S. V. Levinzon Measurement of Electrical and Magnetic Quantities Pages: 56 - 57
Simple meter for small nonlinearities N. I. Segeda Measurement of Electrical and Magnetic Quantities Pages: 58 - 61
Error of an automatic testing system for nonlinear-distortion meters V. I. PampuroA. L. Kochergin Measurement of Electrical and Magnetic Quantities Pages: 62 - 65
Automatic installation for determining the dynamic resistance of power rectifiers V. G. VarzarI. M. Gavrilov Measurement of Electrical and Magnetic Quantities Pages: 65 - 67
Measurement of electromagnetic parameters of radial-line shaped materials M. V. BychkovaN. A. ShchetkinN. N. Chernousova Measurement of Electrical and Magnetic Quantities Pages: 67 - 70
Direct-current regulator for magnetic measuring equipment V. P. KomlevV. P. ZakharovS. I. Malafeev Measurement of Electrical and Magnetic Quantities Pages: 70 - 71
Ferrometer for testing the hysteresis-loop parameters of ferrites G. S. KuskovV. G. Antonov Measurement of Electrical and Magnetic Quantities Pages: 72 - 74
Particular design features of self-oscillating meters with Λ-diodes É. I. ArshN. I. TverdostupV. S. Khandetskii Measurement of Electrical and Magnetic Quantities Pages: 75 - 77
Standard samples for the optical transmission of single-crystal silicon containing oxygen L. P. KholodnyiM. A. Il'inV. Yu. Rogulin Physicochemical Measurements Pages: 78 - 81
Improved method of checking the measurement characteristics of four-probe measurement transducers S. G. AgrachevA. E. VolpyanskiiA. A. Meier Physicochemical Measurements Pages: 81 - 82
Estimate of the quality of epitaxial p-n structures by the external quantum yield of radiation V. Yu. RogulinV. É. ShubE. V. Popova Physicochemical Measurements Pages: 83 - 84
Method of statistical estimation of the quality of semiconductor silicon I. P. KaganovskiiR. I. Genkina Physicochemical Measurements Pages: 85 - 87