1. Automatic ultrasonic defect locating and sizing by a probabilistic approach with high accuracy

   • Zhang Jiaping

   OriginalPaper Pages: 213 - 223

2. Some examples of nondestructive flaw detection by shearography

   • F. S. Chau
   • S. L. Toh
   • H. M. Shang

   OriginalPaper Pages: 225 - 234

3. Nondestructive low-cycle fatigue characterization of multi-layer thin film structures

   • Yoshiki Oshida
   • P. C. Chen

   OriginalPaper Pages: 235 - 245

4. An iterative calculation of eddy-current responses due to three-dimensional defects

   • G. L. Hower
   • D. E. Hadlock

   OriginalPaper Pages: 247 - 255