Electrical and optical characterization of regrown PHEMT layer structures on etched GaAs surfaces B. SathyaK. RadhakrishnanS. F. Yoon OriginalPaper Pages: 379 - 382
Conductive and transparent ZnO:Al thin films obtained by chemical spray M. de la L. OlveraA. MaldonadoJ. Can~etas-Ortega OriginalPaper Pages: 383 - 387
Direct silver bonding – an alternative for substrates in power semiconductor packaging C. Chr. Schu¨lerA. StuckU. Ta¨ck OriginalPaper Pages: 389 - 396
Thermal and optical properties of Ge5Bi18Se77 films T. RajagopalanG. B. Reddy OriginalPaper Pages: 397 - 400
EPR and magnetic susceptibility studies on V2 O5-P2O5-PbO glasses I. ArdeleanO. CozarS. Simon OriginalPaper Pages: 401 - 404
Chemical solution method for fabrication of nanocrystalline iron(III) oxide thin films Biljana PejovaMetodija NajdoskiArdijana Isahi OriginalPaper Pages: 405 - 409
Porosity development of RuO2 filled glass thick films on aluminum nitride substrates at elevated temperatures Wenjea J. TsengChir-Jang TsaiShen-Li Fu OriginalPaper Pages: 411 - 417
Dielectric properties of sintered materials prepared from glass-ZrO2-SrTiO3 mixtures Koichiro TsuzukuSeiichi TarutaHiroshi Kishi OriginalPaper Pages: 419 - 424
Influence of poling conditions on the piezoelectric properties of PZT ceramics Yamakawa TakahiroKataoka MasakoSashida Norikazu OriginalPaper Pages: 425 - 428
Composition and electronic properties of a-SiGe:H alloys produced from ultrathin layers of a-Si:H/a-Ge:H M.S. Abo Ghazala OriginalPaper Pages: 429 - 432
Monitoring the effects of storage on the rheological properties of solder paste T. A. NgutyN. N. Ekere OriginalPaper Pages: 433 - 437
Annealing effects on electrical characteristics of 100 MeV 28Si implantation in GaAs A. M. NarsaleA. R. DamleV. P. Salvi OriginalPaper Pages: 439 - 443
Microstructure and electrical properties of the SnO2 glass composite containing Cu particles precipitated by reducing copper oxides – Effect of particle size of reducing agent Haruhisa ShiomiKaori Umehara OriginalPaper Pages: 445 - 452
