1. Growth and mechanical properties of GeSi bulk crystals

   • I. Yonenaga

   OriginalPaper Pages: 329 - 333

2. Impact of high energy particle irradiation on the electrical performance of Si_1−x Ge _x epitaxial diodes

   • H. Ohyama
   • K. Hayama
   • H. Sunaga

   OriginalPaper Pages: 335 - 337

3. Point defect redistribution in Si_1−x Ge _x alloys

   • A. D. N. Paine
   • A. F. W. Willoughby
   • J. M. Bonar

   OriginalPaper Pages: 339 - 343

4. Selective and non-selective growth of self-aligned SiGe HBT structures by LPCVD epitaxy

   • J. M. Bonar
   • J. Schiz
   • P. Ashburn

   OriginalPaper Pages: 345 - 349

5. Monitoring of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, electrical data and raman spectroscopy

   • P. J. Mcnally
   • J. W. Curley
   • I. DeWolf

   OriginalPaper Pages: 351 - 358

6. Non-equilibrium thermodynamic analysis on the behaviour of point defects in growing silicon crystals: effects of stress

   • K. Tanahashi
   • N. Inoue

   OriginalPaper Pages: 359 - 363

7. Low-dose SIMOX wafers for LSIs fabricated with internal-thermal-oxidation (ITOX) process: electrical characterization

   • A. Matsumura
   • K. Kawamura
   • Y. Nagatake

   OriginalPaper Pages: 365 - 371

8. Electrical characterization of ECR enhaced deposited silicon nitride bilayers for high quality Al/SiN_x/InP MIS structure fabrication

   • S. Duen~as
   • R. Pela´ez
   • G. Gonza´lez-Di´az

   OriginalPaper Pages: 373 - 377

9. Use of anodic tantalum pentoxide for high-density capacitor fabrication

   • S. Duen~as
   • E. Casta´n
   • P. A. Sullivan

   OriginalPaper Pages: 379 - 384

10. Ion beam synthesis of compound nanoparticles in SiO₂

    • A. Pe´rez-Rodri´guez
    • B. Garrido
    • R. Rodri´guez

    OriginalPaper Pages: 385 - 391

11. Kinetic and electrical characterization of thin silicon oxide films obtained by electron cyclotron resonance plasma

    • M. J. Herna´ndez
    • M. Cervera
    • J. Piqueras

    OriginalPaper Pages: 393 - 398

12. Mechanism of GaAs transport by water reaction application to the growth of thick epitaxial layers

    • M. Hammadi
    • J. C. Bourgoin
    • H. Samic

    OriginalPaper Pages: 399 - 402

13. Radiation damage of In_0.53Ga_0.47As photodiodes by high energy particles

    • H. Ohyam
    • T. Kudou
    • H. Sunaga

    OriginalPaper Pages: 403 - 405

14. Electrical carrier activation in Zn⁺ implanted and low-power pulsed-laser annealed InP in nitrogen atmosphere

    • C. Pizzuto
    • G. Zollo
    • G. Vitali

    OriginalPaper Pages: 407 - 411

15. Electrical characterization of deep levels existing in fully implanted and rapid thermal annealed p⁺n InP junctions

    • L. Quintanilla
    • S. Duen~as
    • J. Barbolla

    OriginalPaper Pages: 413 - 418

16. Study of the kink effect in AlInAs/GaInAs/InP composite channel HFETs

    • B. Georgescu
    • A. Souifi
    • G. Post

    OriginalPaper Pages: 419 - 423

17. Electrical characterization of Si⁺ and Si⁺/P⁺ implanted N⁺P⁺In_0.53Ga_0.47As junctions

    • M. N. Blanco
    • E. Redondo
    • G. Gonza´lez-Diaz

    OriginalPaper Pages: 425 - 428

18. Recent developments in the design and fabrication of visible photonic band gap waveguide devices

    • M. D. B. Charlton
    • G. J. Parker
    • M. E. Zoorob

    OriginalPaper Pages: 429 - 440

19. Electrodeposited p-type and n-type ZnSe layers for light emitting devices and multi-layer tandem solar cells

    • I. M. Dharmadasa
    • A. P. Samantilleke
    • A. Wolska

    OriginalPaper Pages: 441 - 445

20. Tunable microcavity based on InP/air Bragg mirrors

    • R. LE Dantec
    • T. Benyattou
    • R. Blondeau

    OriginalPaper Pages: 447 - 450

21. Active media for optical data processing in optoelectronic devices

    • G. Vāle

    OriginalPaper Pages: 451 - 454

22. High dielectric AlN/Al₂O₃ composite powder using a plasma spray approach for microelectronics application

    • F. Y. C. Boey
    • L. Sun
    • K. A. Khor

    OriginalPaper Pages: 455 - 459

23. Effects of strain rate and temperature on the stress–strain response of solder alloys

    • W. J. Plumbridge
    • C. R. Gagg

    OriginalPaper Pages: 461 - 468