1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes Pages: 143 - 143

2. Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm

   • A. Boni
   • G. Chiorboli
   • S. Mazzoleni

   Analog Mixed Signal Test Pages: 145 - 155

3. Efficient multiple path propagating tests for delay faults

   • Ankan K. Pramanick
   • Sudhakar M. Reddy

   Delay Test Pages: 157 - 172

4. On local transformations and path delay fault testability

   • Harry Hengster
   • Rolf Drechsler
   • Bernd Becker

   Delay Test Pages: 173 - 191

5. Multiple error detection and identification via signature analysis

   • T. Raju Damarla
   • Charles E. Stroud
   • Avinash Sathaye

   Built-in Self-test Pages: 193 - 207

6. Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults

   • Shujian Zhang
   • Rod Byrne
   • D. Michael Miller

   Built-in Self-test Pages: 209 - 221

7. A new DFT methodology for sequential circuits

   • C. Costi
   • M. Serra
   • D. Sciuto

   Design for Testability Pages: 223 - 240

8. Yield fluctuations and defect models

   • Leendert M. Huisman

   Test Quality Pages: 241 - 254

9. On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis

   • V. C. Prasad
   • N. S. C. Babu

   Jetta Letter Pages: 255 - 258

10. The Fifth Asian Test Symposium (ATS'96)

    Call for Papers Pages: 259 - 259

11. 1996 International Test Conference

    Call for Papers Pages: 260 - 260