Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing Benedikt JooßDieter Schramm OriginalPaper Open access 03 June 2023 Pages: 267 - 274
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations K. CouliéH. AzizaW. Rahajandraibe OriginalPaper 25 May 2023 Pages: 275 - 288
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets Zhengfeng HuangHao WangAibin Yan OriginalPaper 09 May 2023 Pages: 289 - 301
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems Sabyasachi DeyatiBarry MuldreyAbhijit Chatterjee OriginalPaper 18 May 2023 Pages: 303 - 322
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits Pradeep Kumar Biswal OriginalPaper 24 May 2023 Pages: 323 - 346
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm Bahman ArastehFarhad Soleimanian GharehchopoghMahsa Torkamanian-Afshar OriginalPaper 20 June 2023 Pages: 347 - 370
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection Vijaypal Singh RathorDeepak SinghMohit Sajwan OriginalPaper 16 June 2023 Pages: 371 - 385
Incomplete Testing of SOC Kunwer Mrityunjay SinghJatindra DekaSantosh Biswas OriginalPaper 29 May 2023 Pages: 387 - 402
