1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 25 April 2023 Pages: 123 - 123

2. Test Technology Newsletter

   News 05 June 2023 Pages: 125 - 127

3. Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network

   • Wenjing Tang
   • Jing Su
   • Yuchan Gao

   OriginalPaper Open access 29 April 2023 Pages: 129 - 140

   

4. Design of INV/BUFF Logic Locking For Enhancing the Hardware Security

   • R. Naveenkumar
   • N. M. Sivamangai
   • S. V. Ashika

   OriginalPaper 05 May 2023 Pages: 141 - 153

   

5. On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

   • H. El Badawi
   • F. Azais
   • F. Lefevre

   OriginalPaper 27 March 2023 Pages: 155 - 170

   

6. Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications

   • Tommaso Melis
   • Emmanuel Simeu
   • Luc Saury

   OriginalPaper 28 March 2023 Pages: 171 - 187

   

7. Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation

   • Tai Song
   • Zhengfeng Huang
   • Krstic Milos

   OriginalPaper 25 April 2023 Pages: 189 - 205

   

8. Multiple Retest Systems for Screening High-Quality Chips

   • Chung-Huang Yeh
   • Jwu E. Chen

   OriginalPaper 20 February 2023 Pages: 207 - 225

   

9. Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift

   • Hui Jiang
   • Fanchen Zhang
   • Theodore Manikas

   OriginalPaper Open access 25 April 2023 Pages: 227 - 243

   

10. A Tunable Concurrent BIST Design Based on Reconfigurable LFSR

    • Ahmad Menbari
    • Hadi Jahanirad

    OriginalPaper 06 March 2023 Pages: 245 - 262