Journal of Electronic Testing: Theory and Applications New Editors – 2023 Announcement 10 February 2023 Pages: 3 - 4
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey Bahareh AsadiSyed Maqsood ZiaAsghar Mohamadian OriginalPaper 28 February 2023 Pages: 11 - 25
Identifying Resistive Open Defects in Embedded Cells under Variations Zahra Paria Najafi-HaghiHans-Joachim Wunderlich OriginalPaper Open access 09 February 2023 Pages: 27 - 40
Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit Wenrun XiaoJidong DiaoDonghui Guo Letter 10 January 2023 Pages: 41 - 55
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing Isaac BrucePraise O. FarayolaDegang Chen OriginalPaper 21 February 2023 Pages: 57 - 69
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram Xiaozhi DuJinjin ZhangYanrong Zhou OriginalPaper 03 February 2023 Pages: 71 - 88
Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation Sourav GhoshSurajit Kumar RoyChandan Giri OriginalPaper 27 February 2023 Pages: 89 - 102
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends Jake ElliotJason Brown OriginalPaper Open access 23 January 2023 Pages: 103 - 110
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm Raghavendra Kumar SakaliNoor Mahammad Shak OriginalPaper 29 March 2023 Pages: 111 - 122