1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 17 February 2023 Pages: 1 - 2

2. Journal of Electronic Testing: Theory and Applications New Editors – 2023

   Announcement 10 February 2023 Pages: 3 - 4

   

3. 2022 Reviewers

   Announcement 22 February 2023 Pages: 5 - 6

4. Test Technology Newsletter

   News 14 March 2023 Pages: 7 - 9

   

5. Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey

   • Bahareh Asadi
   • Syed Maqsood Zia
   • Asghar Mohamadian

   OriginalPaper 28 February 2023 Pages: 11 - 25

   

6. Identifying Resistive Open Defects in Embedded Cells under Variations

   • Zahra Paria Najafi-Haghi
   • Hans-Joachim Wunderlich

   OriginalPaper Open access 09 February 2023 Pages: 27 - 40

   

7. Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit

   • Wenrun Xiao
   • Jidong Diao
   • Donghui Guo

   Letter 10 January 2023 Pages: 41 - 55

   

8. A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing

   • Isaac Bruce
   • Praise O. Farayola
   • Degang Chen

   OriginalPaper 21 February 2023 Pages: 57 - 69

   

9. DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram

   • Xiaozhi Du
   • Jinjin Zhang
   • Yanrong Zhou

   OriginalPaper 03 February 2023 Pages: 71 - 88

   

10. Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation

    • Sourav Ghosh
    • Surajit Kumar Roy
    • Chandan Giri

    OriginalPaper 27 February 2023 Pages: 89 - 102

    

11. An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends

    • Jake Elliot
    • Jason Brown

    OriginalPaper Open access 23 January 2023 Pages: 103 - 110

    

12. Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm

    • Raghavendra Kumar Sakali
    • Noor Mahammad Shak

    OriginalPaper 29 March 2023 Pages: 111 - 122