1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 19 May 2022 Pages: 125 - 126

2. Test Technology Newsletter

   • Stefano Di Carlo

   News 28 April 2022 Pages: 127 - 129

   

3. Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp Model

   • İshak Parlar
   • M. Nuri Almali

   OriginalPaper 23 March 2022 Pages: 131 - 143

   

4. FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications

   • Dev Narayan Yadav
   • Phrangboklang Lyngton Thangkhiew
   • Indranil Sengupta

   OriginalPaper 13 May 2022 Pages: 145 - 163

   

5. An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation

   • Shuo Cai
   • Binyong He
   • Fei Yu

   OriginalPaper 15 April 2022 Pages: 165 - 180

   

6. Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application

   • N. Siva Balan
   • B. S. Murugan

   OriginalPaper 06 April 2022 Pages: 181 - 193

   

7. Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process

   • Huajie Huang
   • Junjie Dai
   • Junhui Li

   OriginalPaper 20 April 2022 Pages: 195 - 203

   

8. Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive Optimization Algorithms

   • Bahman Arasteh
   • Seyed Mohamad Javad Hosseini

   OriginalPaper 11 April 2022 Pages: 205 - 215

   

9. Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications

   • Shravani Chandaka
   • Balaji Narayanam

   OriginalPaper 09 June 2022 Pages: 217 - 230