1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 14 March 2022 Pages: 1 - 2

2. New Editors – 2022

   Announcement 19 March 2022 Pages: 3 - 4

   

3. 2021 Reviewers

   Announcement 14 March 2022 Pages: 5 - 6

4. Test Technology Newsletter

   News 22 March 2022 Pages: 7 - 8

   

5. Hardware Obfuscation for IP Protection of DSP Applications

   • Naveenkumar R
   • N.M. Sivamangai
   • G. Akashraj Nissi

   OriginalPaper 14 March 2022 Pages: 9 - 20

   

6. Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies

   • Yujie Zhao
   • Kentaroh Katoh
   • Tamotsu Ichikawa

   OriginalPaper 09 March 2022 Pages: 21 - 38

   

7. Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams

   • Dengli Bu
   • Junjie Yan
   • Haohao Yuan

   OriginalPaper 25 March 2022 Pages: 39 - 62

   

8. A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design

   • Yingchun Lu
   • Guangzhen Hu
   • Zhengfeng Huang

   OriginalPaper 09 April 2022 Pages: 63 - 76

   

9. A New Neural Network Based on CNN for EMIS Identification

   • Ying-chun Xiao
   • Feng Zhu
   • Yang Yang

   OriginalPaper 08 March 2022 Pages: 77 - 89

   

10. Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation

    • Abhishek Bhattacharjee
    • Abhishek Nag
    • Sambhu Nath Pradhan

    OriginalPaper 04 April 2022 Pages: 91 - 105

    

11. A Low-cost BIST Design Supporting Offline and Online Tests

    • Ahmad Menbari
    • Hadi Jahanirad

    OriginalPaper 10 March 2022 Pages: 107 - 123