Review of Manufacturing Process Defects and Their Effects on Memristive Devices L. M. Bolzani PoehlsM. C. R. FiebackT. Gemmeke OriginalPaper Open access 21 October 2021 Pages: 427 - 437
Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System Milos MilovancevicAleksandar DimovMiroslav Planić OriginalPaper 28 September 2021 Pages: 439 - 452
Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits Tsai-Chieh ChenChia-Cheng PaiI-Wei Chiu OriginalPaper 30 September 2021 Pages: 453 - 471
SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier Mahshid TebyanianAzadeh MokhtarpourAlireza Shafieinejad OriginalPaper 24 August 2021 Pages: 473 - 487
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications Aibin YanAoran CaoXiaoqing Wen OriginalPaper 25 August 2021 Pages: 489 - 502
Fault-Aware Dependability Enhancement Techniques for Phase Change Memory Shyue-Kung LuHui-Ping LiChi-Tien Sun OriginalPaper 14 August 2021 Pages: 503 - 513
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability Hussein BazziHassen AzizaAdnan Harb OriginalPaper 11 October 2021 Pages: 515 - 532
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers Marco GrossiMartin Omaña OriginalPaper 03 November 2021 Pages: 533 - 544
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems Qi WangYiming OuyangDakai Zhu OriginalPaper 18 September 2021 Pages: 545 - 559
HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits Mishal Fatima MinhasOsman HasanSa’ed Abed OriginalPaper 26 June 2021 Pages: 561 - 567
