A Novel Approach of Data Content Zeroization Under Memory Attacks Ankush SrivastavaProkash Ghosh OriginalPaper 12 May 2020 Pages: 147 - 167
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter S. RathnapriyaV. Manikandan OriginalPaper 30 April 2020 Pages: 169 - 181
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films Jinqun GeTian XiaGuoan Wang OriginalPaper 30 March 2020 Pages: 183 - 188
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits H. El BadawiFlorence AzaisF. Lefevre OriginalPaper 02 April 2020 Pages: 189 - 203
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips Xijun HuangChuanpei XuLong Zhang OriginalPaper 18 March 2020 Pages: 205 - 218
Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification Gaurav SharmaLava BhargavaVinod Kumar OriginalPaper 14 April 2020 Pages: 219 - 237
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs Tanusree KaibarttaG. P. BiswasDebesh Kumar Das OriginalPaper 07 April 2020 Pages: 239 - 253
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications Ambika Prasad ShahSantosh Kumar VishvakarmaMichael Hübner OriginalPaper 06 March 2020 Pages: 255 - 269
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects T. CopettiT. R. BalenL. Bolzani Poehls OriginalPaper 23 May 2020 Pages: 271 - 284
Speed-Up in Test Methods Using Probabilistic Merit Indicators Mahtab FooladiArezoo Kamran OriginalPaper 02 April 2020 Pages: 285 - 296
