Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components Seyed Mostafa BanitabaRoya M. AhariMahdi Karbasian OriginalPaper 23 January 2020 Pages: 9 - 21
Trojan Detection Test for Clockless Circuits Ricardo Aquino GuazzelliMatheus Garay TrindadeRodrigo Possamai Bastos OriginalPaper 07 February 2020 Pages: 23 - 31
On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits B. DeveautourA. VirazelV. Gherman OriginalPaper 23 January 2020 Pages: 33 - 46
Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems Alejandro Serrano-CasesFelipe Restrepo-CalleAntonio Martínez-Álvarez OriginalPaper 19 December 2019 Pages: 47 - 57
Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration Avishek ChoudhuryBiplab K. Sikdar OriginalPaper 18 February 2020 Pages: 59 - 73
Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay Zhexi YaoLingchao ZhuJinbo Wang OriginalPaper 28 January 2020 Pages: 75 - 86
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors Adeboye Stephen OyeniranRaimund UbarJaan Raik Letter 20 March 2020 Pages: 87 - 103
An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits Mousum HandiqueJantindra Kumar DekaSantosh Biswas OriginalPaper 04 February 2020 Pages: 105 - 122
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures Soham RoyBrandon StieneVishwani D. Agrawal OriginalPaper 03 February 2020 Pages: 123 - 133
An Efficient Accuracy Reconfigurable CLA Adder Designs Using Complementary Logic Sujit Kumar PatelBharat GargShireesh Kumar Rai Manuscript 10 January 2020 Pages: 135 - 142