1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 30 January 2020 Pages: 1 - 2

2. New Editor – 2020

   Announcement 08 February 2020 Pages: 3 - 3

   

3. 2019 Reviewers

   Announcement 31 January 2020 Pages: 5 - 6

4. Test Technology Newsletter February 2020

   News 05 February 2020 Pages: 7 - 8

   

5. Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components

   • Seyed Mostafa Banitaba
   • Roya M. Ahari
   • Mahdi Karbasian

   OriginalPaper 23 January 2020 Pages: 9 - 21

   

6. Trojan Detection Test for Clockless Circuits

   • Ricardo Aquino Guazzelli
   • Matheus Garay Trindade
   • Rodrigo Possamai Bastos

   OriginalPaper 07 February 2020 Pages: 23 - 31

   

7. On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits

   • B. Deveautour
   • A. Virazel
   • V. Gherman

   OriginalPaper 23 January 2020 Pages: 33 - 46

   

8. Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

   • Alejandro Serrano-Cases
   • Felipe Restrepo-Calle
   • Antonio Martínez-Álvarez

   OriginalPaper 19 December 2019 Pages: 47 - 57

   

9. Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration

   • Avishek Choudhury
   • Biplab K. Sikdar

   OriginalPaper 18 February 2020 Pages: 59 - 73

   

10. Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay

    • Zhexi Yao
    • Lingchao Zhu
    • Jinbo Wang

    OriginalPaper 28 January 2020 Pages: 75 - 86

    

11. High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors

    • Adeboye Stephen Oyeniran
    • Raimund Ubar
    • Jaan Raik

    Letter 20 March 2020 Pages: 87 - 103

    

12. An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits

    • Mousum Handique
    • Jantindra Kumar Deka
    • Santosh Biswas

    OriginalPaper 04 February 2020 Pages: 105 - 122

    

13. Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures

    • Soham Roy
    • Brandon Stiene
    • Vishwani D. Agrawal

    OriginalPaper 03 February 2020 Pages: 123 - 133

    

14. An Efficient Accuracy Reconfigurable CLA Adder Designs Using Complementary Logic

    • Sujit Kumar Patel
    • Bharat Garg
    • Shireesh Kumar Rai

    Manuscript 10 January 2020 Pages: 135 - 142