Test Flow Selection for Stacked Integrated Circuits Breeta SenGuptaDimitar NikolovErik Larsson OriginalPaper Open access 14 August 2019 Pages: 425 - 440
Test Generation for Bridging Faults in Reversible Circuits Using Path-Level Expressions Mousum HandiqueSantosh BiswasJantindra Kumar Deka OriginalPaper 22 June 2019 Pages: 441 - 457
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements Chung-Huang YehJwu E. Chen OriginalPaper 02 July 2019 Pages: 459 - 472
An Efficient Wavelet Based Transient Current Test towards Detection of Data Retention Faults in SRAM Princy PN.M. Sivamangai OriginalPaper 30 August 2019 Pages: 473 - 483
Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM Shyue-Kung LuHung-Kai HuangKohei Miyase OriginalPaper 13 August 2019 Pages: 485 - 495
16- Layer PCB Channel Design with Minimum Crosstalk and Optimization of VIA and TDR Analysis A. KavithaCh. Sekhararao KaitepalliShaik Ahemedali OriginalPaper 04 July 2019 Pages: 497 - 517
Security Analysis and Improvement of the Pseudo-random Number Generator Based on Piecewise Logistic Map Dragan Lambić OriginalPaper 09 August 2019 Pages: 519 - 527
Hardware Trojan Detection Leveraging a Novel Golden Layout Model Towards Practical Applications Yanjiang LiuJiaji HeYiqiang Zhao OriginalPaper 20 July 2019 Pages: 529 - 541
Enhanced Authentication Using Hybrid PUF with FSM for Protecting IPs of SoC FPGAs J. KokilaN. Ramasubramanian OriginalPaper 29 June 2019 Pages: 543 - 558
Connectivity Test for System in Package Interconnects JungHo KangKyungsoo ChaeJaeyoun Jeong OriginalPaper 17 June 2019 Pages: 559 - 565
Electromagnetic Parameters Measurement of Sheet Using Separate Microstrip Line Yunpeng ZhangEn LiHu Zheng OriginalPaper 15 June 2019 Pages: 567 - 572
