Testing of Current Carrying Capacity of Conducting Tracks in High Power Flexible Printed Circuit Boards Remesh Kumar K RK. Shreekrishna Kumar OriginalPaper 27 February 2019 Pages: 131 - 143
Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems Maha KooliGiorgio Di NataleAlberto Bosio OriginalPaper 16 March 2019 Pages: 145 - 162
Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits Shuo CaiWeizheng WangBinyong He OriginalPaper 12 April 2019 Pages: 163 - 172
An Integrated on-Silicon Verification Method for FPGA Overlays Alexandra KourfaliFlorian FrickeDirk Stroobandt OriginalPaper 27 March 2019 Pages: 173 - 189
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects G. Cardoso MedeirosE. BrumT. Balen OriginalPaper 26 March 2019 Pages: 191 - 200
A Unified Approach to Detect and Distinguish Hardware Trojans and Faults in SRAM-based FPGAs Omid RanjbarSiavash Bayat-SarmadiHossein Asadi OriginalPaper 05 March 2019 Pages: 201 - 214
A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip Biswajit BhowmikSantosh BiswasBhargab B. Bhattacharya OriginalPaper 02 May 2019 Pages: 215 - 243
Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110 MHz) D. A. OumarM. I. BoukhariJ. J. Rousseau OriginalPaper 19 March 2019 Pages: 245 - 252
Low-Cost Strategy for Bus Propagation Delay Reduction M. OmañaS. GovindarajC. Metra OriginalPaper 26 March 2019 Pages: 253 - 260
Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers Marco GrossiMartin Omaña OriginalPaper 19 March 2019 Pages: 261 - 267