1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 20 November 2018 Pages: 615 - 617

   

2. 2017 JETTA-TTTC Best Paper Award

   Announcement 29 October 2018 Pages: 619 - 620

   

3. Test Technology Newsletter

   News 08 November 2018 Pages: 621 - 622

   

4. Multiple Missing Cell Defect Modeling for QCA Devices

   • Vaishali H. Dhare
   • Usha S. Mehta

   OriginalPaper 20 November 2018 Pages: 623 - 641

   

5. Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFT

   • Xu Bai
   • Hui Hu
   • Fulu Liu

   OriginalPaper 30 October 2018 Pages: 643 - 650

   

6. Generation Methodology for Good-Enough Approximate Modules of ATMR

   • Abdus Sami Hassan
   • Tooba Arifeen
   • Jeong-A Lee

   OriginalPaper 14 November 2018 Pages: 651 - 665

   

7. Path Representation in Circuit Netlists Using Linear-Sized ZDDs with Optimal Variable Ordering

   • Stelios N. Neophytou
   • Maria K. Michael

   OriginalPaper 15 November 2018 Pages: 667 - 683

   

8. LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs

   • Haiying Yuan
   • Changshi Zhou
   • Xiuyu Wang

   OriginalPaper 29 October 2018 Pages: 685 - 695

   

9. New Lightweight Architectures for Secure FSM Design to Thwart Fault Injection and Trojan Attacks

   • Vijaypal Singh Rathor
   • Bharat Garg
   • G. K. Sharma

   OriginalPaper 03 November 2018 Pages: 697 - 708

   

10. Security Analysis of the Efficient Chaos Pseudo-random Number Generator Applied to Video Encryption

    • Dragan Lambić
    • Aleksandar Janković
    • Musheer Ahmad

    OriginalPaper 08 November 2018 Pages: 709 - 715

    

11. A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error

    • Xiaozhi Du
    • Dongyang Luo
    • Shuhuan Liu

    OriginalPaper 24 October 2018 Pages: 717 - 733

    

12. Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library

    • Pablo Ilha Vaz
    • Thiago Hanna Both
    • Gilson Inácio Wirth

    OriginalPaper 12 November 2018 Pages: 735 - 747

    

13. Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis

    • Nabil El Belghiti Alaoui
    • Alexandre Boyer
    • Arnaud Viard

    OriginalPaper 17 November 2018 Pages: 749 - 762

    

14. A Simplified Calibration Methodology for On-Chip Couplers

    • Wei Jiang
    • Guoan Wang

    OriginalPaper 08 October 2018 Pages: 763 - 768