1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 12 July 2018 Pages: 371 - 372

2. Test Technology Newsletter

   News 06 July 2018 Pages: 373 - 374

   

3. Test and Reliability in Approximate Computing

   • Lorena Anghel
   • Mounir Benabdenbi
   • Elena Ioana Vatajelu

   OriginalPaper 31 May 2018 Pages: 375 - 387

   

4. High Performance Static Segment On-Chip Memory for Image Processing Applications

   • R. Jothin
   • C. Vasanthanayaki

   OriginalPaper 16 July 2018 Pages: 389 - 404

   

5. Leakage-Aware Droop Measurement Built-in Self-Test Circuit for Digital Low-Dropout Regulators

   • Aydin Dirican
   • Cagatay Ozmen
   • Martin Margala

   OriginalPaper 21 July 2018 Pages: 405 - 415

   

6. An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays

   • Felipe Silva
   • Jardel Silveira
   • Otávio Lima Jr

   OriginalPaper 06 July 2018 Pages: 417 - 433

   

7. Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories

   • Shyue-Kung Lu
   • Hao-Cheng Jheng
   • Masaki Hashizume

   OriginalPaper 16 July 2018 Pages: 435 - 446

   

8. Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition

   • Ying Zhang
   • Li Ling
   • Jie Xiao

   OriginalPaper 06 June 2018 Pages: 447 - 460

   

9. Hardware Trojan Detection Using an Advised Genetic Algorithm Based Logic Testing

   • M. A. Nourian
   • M. Fazeli
   • D. Hely

   OriginalPaper 05 July 2018 Pages: 461 - 470

   

10. Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-Flops

    • Riadul Islam

    OriginalPaper 27 June 2018 Pages: 471 - 485

    

11. Fault Tolerance Mechanisms for FPGA-Based Regular Expression Matching

    • Marcos T. Leipnitz
    • Gabriel L. Nazar

    OriginalPaper 20 June 2018 Pages: 487 - 506