Hardware Trojan Detection Based on Logical Testing Amin BazzaziMohammad Taghi Manzuri ShalmaniAli Mohammad Afshin Hemmatyar OriginalPaper 22 June 2017 Pages: 381 - 395
An Access Mechanism for Embedded Sensors in Modern SoCs Miao (Tony) HeMark Tehranipoor OriginalPaper 24 June 2017 Pages: 397 - 413
Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation Modes ChengLin YangFang ChenShulin Tian OriginalPaper 14 July 2017 Pages: 415 - 429
An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism Alfonso Martínez-CruzRicardo Barrón-FernándezKwang-Ting (Tim) Cheng OriginalPaper 03 June 2017 Pages: 431 - 447
A Near-Threshold Soft Error Resilient 7T SRAM Cell with Low Read Time for 20 nm FinFET Technology Rahebeh Niaraki AsliShiva Taghipour OriginalPaper 22 May 2017 Pages: 449 - 462
Susceptible Workload Evaluation and Protection using Selective Fault Tolerance Mauricio D. GutierrezVasileios TenentesTom J. Kazmierski OriginalPaper Open access 20 June 2017 Pages: 463 - 477
ACM: An Energy-Efficient Accuracy Configurable Multiplier for Error-Resilient Applications Bharat GargG. K. Sharma OriginalPaper 24 June 2017 Pages: 479 - 489
Test of Mechanical Failure for Via Holes and Solder Joints of Complex Interconnect Structure Yuling ShangLiyuan SunJianfeng Ma OriginalPaper 14 July 2017 Pages: 491 - 499
A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip Babak AghaeiAhmad KhademzadehKambiz Badie OriginalPaper 05 June 2017 Pages: 501 - 513
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies Amit KarelMariane ComteMichel Renovell OriginalPaper 29 June 2017 Pages: 515 - 527
Built-In Fault Localization Circuitry for High Performance FPGA Based Implementations Ayan PalchaudhuriAnindya Sundar Dhar OriginalPaper 04 July 2017 Pages: 529 - 537
