1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 08 December 2016 Pages: 653 - 654

2. Test Technology Newsletter

   News 09 November 2016 Pages: 655 - 657

3. 2015 JETTA-TTTC Best Paper Award

   Announcement 11 November 2016 Pages: 659 - 660

4. Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances

   • Yiqian Cui
   • Junyou Shi
   • Zili Wang

   OriginalPaper 08 November 2016 Pages: 661 - 679

   

5. Mahalanobis Distance Based Approach for Anomaly Detection of Analog Filters Using Frequency Features and Parzen Window Density Estimation

   • Zewen Hu
   • Mingqing Xiao
   • Yawei Ge

   OriginalPaper 08 November 2016 Pages: 681 - 693

   

6. Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory

   • Qingyu Chen
   • Li Chen
   • Mo Chen

   OriginalPaper 08 November 2016 Pages: 695 - 703

   

7. New Methodology for Complete Properties Extraction from Simulation Traces Guided with Static Analysis

   • Mohamed Hanafy
   • Hazem Said
   • Ayman M. Wahba

   OriginalPaper 28 November 2016 Pages: 705 - 719

   

8. An Effective Power-Aware At-Speed Test Methodology for IP Qualification and Characterization

   • Kapil Juneja
   • Darayus Adil Patel
   • Patrick Girard

   OriginalPaper 06 October 2016 Pages: 721 - 733

   

9. Optimal Selective Count Compatible Runlength Encoding for SOC Test Data Compression

   • Harpreet Vohra
   • Amardeep Singh

   OriginalPaper 26 October 2016 Pages: 735 - 747

   

10. A Routability-Aware Algorithm for Both Global and Local Interconnect Resource Test and Diagnosis of Xilinx SRAM-FPGAs

    • Aiwu Ruan
    • Haiyang Huang
    • Yifan Zhao

    OriginalPaper 09 November 2016 Pages: 749 - 762

    

11. Four-Port Network Parameters Extraction Method for Partially Depleted SOI with Body-Contact Structure

    • Jun Liu
    • Yu Ping Huang
    • Kai Lu

    OriginalPaper 11 November 2016 Pages: 763 - 767