1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 09 September 2016 Pages: 505 - 506

2. Test Technology Newsletter

   News 31 August 2016 Pages: 507 - 509

   

3. Optimization of Test Wrapper for TSV Based 3D SOCs

   • Surajit Kumar Roy
   • Chandan Giri
   • Hafizur Rahaman

   OriginalPaper 05 September 2016 Pages: 511 - 529

   

4. A Novel Approach for Diagnosis of Analog Circuit Fault by Using GMKL-SVM and PSO

   • Chaolong Zhang
   • Yigang He
   • Zhigang Li

   OriginalPaper 27 September 2016 Pages: 531 - 540

   

5. Reliability Analysis of Fault-Tolerant Bus-Based Interconnection Networks

   • Fathollah Bistouni
   • Mohsen Jahanshahi

   OriginalPaper 09 July 2016 Pages: 541 - 568

   

6. Analyzing Vulnerability of Asynchronous Pipeline to Soft Errors: Leveraging Formal Verification

   • Faiq Khalid Lodhi
   • Syed Rafay Hasan
   • Falah Awwad

   OriginalPaper 19 September 2016 Pages: 569 - 586

   

7. Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT

   • T. Nandha Kumar
   • Haider A. F. Almurib
   • Fabrizio Lombardi

   OriginalPaper 31 August 2016 Pages: 587 - 599

   

8. Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing

   • Michihiro Shintani
   • Takumi Uezono
   • Takashi Sato

   OriginalPaper 14 September 2016 Pages: 601 - 609

   

9. A Comprehensive FPGA-Based Assessment on Fault-Resistant AES against Correlation Power Analysis Attack

   • Jaya Dofe
   • Hoda Pahlevanzadeh
   • Qiaoyan Yu

   OriginalPaper 25 June 2016 Pages: 611 - 624

   

10. CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern Generator

    • Kuen-Wei Yeh
    • Jiun-Lang Huang
    • Laung-Terng Wang

    OriginalPaper 09 September 2016 Pages: 625 - 638

    

11. Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding

    • Haiying Yuan
    • Zijian Ju
    • Xiuyu Wang

    OriginalPaper 19 May 2016 Pages: 639 - 647

    

12. A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors

    • Bing Hou
    • Tong Liu
    • Wenbo Wang

    OriginalPaper 15 September 2016 Pages: 649 - 652