Volume 32, Issue 4

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August 2016

Special Issue on Analog, Mixed-Signal and RF Testing

Issue Editors:

Gildas Léger,
Carsten Wegener

11 articles in this issue

Editorial
Vishwani D. Agrawal
EditorialNotes 20 July 2016 Pages: 399 - 399
Test Technology Newsletter

News 07 July 2016 Pages: 401 - 403
Guest Editorial: Analog, Mixed-Signal and RF Testing
Gildas Léger
Carsten Wegener
EditorialNotes 18 July 2016 Pages: 405 - 406
A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs
Guillaume Renaud
Manuel J. Barragan
Hervé Naudet
OriginalPaper 11 July 2016 Pages: 407 - 421
A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O
Yan Li
Steven Bielby
Gordon W. Roberts
OriginalPaper Open access 08 July 2016 Pages: 423 - 436
A Wideband Digital-to-Frequency Converter with Built-In Mechanism for Self-Interference Mitigation
Imran Bashir
Robert B. Staszewski
Poras T. Balsara
OriginalPaper 14 July 2016 Pages: 437 - 445
An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories
Friedrich Peter Leisenberger
Gregor Schatzberger
OriginalPaper 08 July 2016 Pages: 447 - 458
The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM
WenXin Yu
Yongbo Sui
Junnian Wang
OriginalPaper 22 June 2016 Pages: 459 - 465
Fault Diagnosis in Highly Dependable Medical Wearable Systems
Cristina C. Oliveira
José Machado da Silva
OriginalPaper 23 July 2016 Pages: 467 - 479
Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks
Qian Lin
Haipeng Fu
Qianfu Cheng
OriginalPaper 09 July 2016 Pages: 481 - 489
A New Approach for Modeling Inconsistencies in Digital-Assisted Analog Design
Gürkan Uygur
Sebastian M. Sattler
OriginalPaper 03 August 2016 Pages: 491 - 503

Volume 32, Issue 4

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