1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 22 March 2016 Pages: 107 - 108

2. Test Technology Newsletter

   News 02 March 2016 Pages: 109 - 110

   

3. Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM

   • Kun-Lun Luo
   • Ming-Hsueh Wu
   • Chen-An Chen

   OriginalPaper 03 February 2016 Pages: 111 - 123

   

4. Exemplar-based Failure Triage for Regression Design Debugging

   • Zissis Poulos
   • Andreas Veneris

   OriginalPaper 19 March 2016 Pages: 125 - 136

   

5. A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets

   • Yuanqing Li
   • Lixiang Li
   • Mo Chen

   OriginalPaper 27 February 2016 Pages: 137 - 145

   

6. A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing Cores

   • I. Wali
   • Arnaud Virazel
   • M. Sonza Reorda

   OriginalPaper 01 March 2016 Pages: 147 - 161

   

7. Exploration of Noise Impact on Integrated Bulk Current Sensors

   • João Guilherme Mourão Melo
   • Frank Sill Torres

   OriginalPaper 16 March 2016 Pages: 163 - 173

   

8. An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits

   • A. N. Nagamani
   • S. Ashwin
   • V. K. Agrawal

   OriginalPaper 16 March 2016 Pages: 175 - 196

   

9. New Boolean Equation for Orthogonalizing of Disjunctive Normal Form based on the Method of Orthogonalizing Difference-Building

   • Yavuz Can
   • Hassen Kassim
   • Georg Fischer

   OriginalPaper 17 March 2016 Pages: 197 - 208

   

10. Applications of Mixed-Signal Technology in Digital Testing

    • Baohu Li
    • Vishwani D. Agrawal

    OriginalPaper 11 March 2016 Pages: 209 - 225

    

11. A CMOS Ripple Detector for Voltage Regulator Testing

    • Hieu Nguyen
    • Cagatay Ozmen
    • Martin Margala

    OriginalPaper Open access 28 January 2016 Pages: 227 - 233

    

12. Design and Temperature Reliability Testing for A 0.6–2.14GHz Broadband Power Amplifier

    • Qian Lin
    • Qian-Fu Cheng
    • Hai-peng Fu

    OriginalPaper 05 February 2016 Pages: 235 - 240