A Built-in Single Event Upsets Detector for Sequential Cells Yuanqing LiHaibin WangMo Chen OriginalPaper 22 December 2015 Pages: 11 - 20
Optimization of a Particles Detection Chain Based on a VCO Structure K. Coulié-CastellaniW. RahajandraibeJ.-M. Portal OriginalPaper 04 February 2016 Pages: 21 - 30
Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks Cong HuZhi LiMengyi Jia OriginalPaper 20 January 2016 Pages: 31 - 42
Simulation-based Fault Injection with QEMU for Speeding-up Dependability Analysis of Embedded Software Davide FerrarettoGraziano Pravadelli OriginalPaper 09 January 2016 Pages: 43 - 57
A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding Haiying YuanKun GuoZijian Ju OriginalPaper 19 January 2016 Pages: 59 - 68
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE Florence AzaïsStéphane David-GrignotFrançois Lefevre OriginalPaper 17 December 2015 Pages: 69 - 82
Practical Analog Circuit Diagnosis Based on Fault Features with Minimum Ambiguities Xiaofeng TangAiqiang Xu OriginalPaper 14 January 2016 Pages: 83 - 95
Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits Haibin WangMulong LiGang Guo OriginalPaper 29 December 2015 Pages: 97 - 103
Erratum to: Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection Sezer GörenCemil Cem GürsoyAbdullah Yildiz Erratum 15 December 2015 Pages: 105 - 106
