1. Editorial

   EditorialNotes Pages: 287 - 287

2. Introduction

   • Ravi K. Gulati
   • Charles F. Hawkins

   EditorialNotes Pages: 289 - 289

3. I _DDQ testing: A review

   • Jerry M. Soden
   • Charles F. Hawkins
   • Weiwei Mao

   ReviewPaper Pages: 291 - 303

4. I _DDQ testing as a component of a test suite: The need for several fault coverage metrics

   • Peter C. Maxwell
   • Robert C. Aitken

   OriginalPaper Pages: 305 - 316

5. I _DDQ testing in CMOS digital ASICs

   • Roger Perry

   OriginalPaper Pages: 317 - 325

6. Reliability benefits of I _DDQ

   • Steven D. McEuen

   OriginalPaper Pages: 327 - 335

7. Quiescent current analysis and experimentation of defective CMOS circuits

   • J. A. Segura
   • V. H. Champac
   • J. A. Rubio

   OriginalPaper Pages: 337 - 348

8. Quietest: A methodology for selecting I _DDQ test vectors

   • Weiwei Mao
   • Ravi K. Gulati

   OriginalPaper Pages: 349 - 357

9. Generation and evaluation of current and logic tests for switch-level sequential circuits

   • Chun-Hung Chen
   • Jacob A. Abraham

   OriginalPaper Pages: 359 - 366

10. Diagnosis of leakage faults with I _DDQ

    • Robert C. Aitken

    OriginalPaper Pages: 367 - 375

11. Algorithms for I _DDQ measurement based diagnosis of bridging faults

    • Sreejit Chakravarty
    • Minsheng Liu

    OriginalPaper Pages: 377 - 385

12. Proportional BIC sensor for current testing

    • Josep Rius
    • J. Figueras

    OriginalPaper Pages: 387 - 396

13. Design of ICs applying built-in current testing

    • Wojciech Maly
    • Marek Patyra

    OriginalPaper Pages: 397 - 406