1. Editorial

   EditorialNotes Pages: 179 - 179

2. A decomposition approach for testing large analog networks

   • Janusz A. Starzyk
   • Hong Dai

   OriginalPaper Pages: 181 - 195

3. Dynamic effects in the detection of bridging faults in CMOS ICs

   • Michele Favalli
   • Piero Olivo
   • Bruno Riccò

   OriginalPaper Pages: 197 - 205

4. Testability analysis and fault modeling of BiCMOS circuits

   • D. Al-Khalili
   • C. Rozon
   • B. Stewart

   OriginalPaper Pages: 207 - 217

5. A model for sequential machine testing and diagnosis

   • J. A. Brzozowski
   • H. Jürgensen

   OriginalPaper Pages: 219 - 234

6. An efficient design of embedded memories and their testability analysis using Markov chains

   • P. Mazumder
   • J. H. Patel

   OriginalPaper Pages: 235 - 250

7. Near-optimal tests for classes of write-triggered coupling faults in RAMs

   • B. F. Cockburn
   • J. A. Brzozowski

   OriginalPaper Pages: 251 - 264

8. Testing of static random access memories by monitoring dynamic power supply current

   • Shyang-Tai Su
   • Rafic Z. Makki

   OriginalPaper Pages: 265 - 278

9. Erratum

   Erratum Pages: 279 - 279

10. Special issue on test economics

    Call for papers Pages: 281 - 281

11. Letters

    Call for papers Pages: 282 - 282