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Dynamic effects in the detection of bridging faults in CMOS ICs Michele FavalliPiero OlivoBruno Riccò OriginalPaper Pages: 197 - 205
Testability analysis and fault modeling of BiCMOS circuits D. Al-KhaliliC. RozonB. Stewart OriginalPaper Pages: 207 - 217
A model for sequential machine testing and diagnosis J. A. BrzozowskiH. Jürgensen OriginalPaper Pages: 219 - 234
An efficient design of embedded memories and their testability analysis using Markov chains P. MazumderJ. H. Patel OriginalPaper Pages: 235 - 250
Near-optimal tests for classes of write-triggered coupling faults in RAMs B. F. CockburnJ. A. Brzozowski OriginalPaper Pages: 251 - 264
Testing of static random access memories by monitoring dynamic power supply current Shyang-Tai SuRafic Z. Makki OriginalPaper Pages: 265 - 278