Volume 29, Issue 2

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April 2013

Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN)

Issue Editors:

Dimitris Gizopoulos,
Said Hamdioui,
Hans Manhaeve

14 articles in this issue

Editorial
Vishwani D. Agrawal
EditorialNotes 06 April 2013 Pages: 121 - 121
Test Technology Newsletter

News 21 March 2013 Pages: 123 - 124
Guest Editorial
Dimitris Gizopoulos
Said Hamdioui
Hans Manhaeve
EditorialNotes 02 April 2013 Pages: 125 - 126
On the Simulation of HCI-Induced Variations of IC Timings at High Level
Olivier Heron
Clement Bertolini
Francois Marc
OriginalPaper 11 April 2013 Pages: 127 - 141
CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis
Liang Chen
Mojtaba Ebrahimi
Mehdi B. Tahoori
OriginalPaper 02 April 2013 Pages: 143 - 158
Self-Adaptive Fault Tolerance in Multi-/Many-Core Systems
Cristiana Bolchini
Matteo Carminati
Antonio Miele
OriginalPaper 17 April 2013 Pages: 159 - 175
Reliability-Aware Heterogeneous 3D Chip Multiprocessor Design
Ismail Akturk
Ozcan Ozturk
OriginalPaper 04 April 2013 Pages: 177 - 184
Circuit Level Concurrent Error Detection in FSMs
Natalja Kehl
Wolfgang Rosenstiel
OriginalPaper 07 April 2013 Pages: 185 - 192
Secure JTAG Implementation Using Schnorr Protocol
Amitabh Das
Jean Da Rolt
Ingrid Verbauwhede
OriginalPaper 24 March 2013 Pages: 193 - 209
Detailed Analysis of Compilation Options for Robust Software-based Embedded Systems
S. Bergaoui
A. Wecxsteen
R. Leveugle
OriginalPaper 02 April 2013 Pages: 211 - 222
Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification
Edgar Leonardo Romero
Marius Strum
Wang Jiang Chau
OriginalPaper 27 March 2013 Pages: 223 - 236
Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks
A. Kavithamani
V. Manikandan
N. Devarajan
OriginalPaper 11 April 2013 Pages: 237 - 240
Novel Self-Timed, Pipelined Clock Scan Architecture
Kanad Chakraborty
James E. Kelly
Brian P. Evans
OriginalPaper 06 March 2013 Pages: 241 - 247
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients
Zhichao Zhang
Yi Ren
Ramaswami Sammynaiken
OriginalPaper 20 March 2013 Pages: 249 - 253

Volume 29, Issue 2

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