Evaluating Different Strategies for Testing Software Product Lines Thelma Elita ColanziWesley Klewerton Guez AssunçãoSilvia Regina Vergilio OriginalPaper 06 February 2013 Pages: 9 - 24
Applying Petri Nets to Modeling of Many-Core Processor Self-Testing when Tests are Performed Randomly Viktor MashkovJiri BarillaPavel Simr OriginalPaper 08 January 2013 Pages: 25 - 34
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults Fang BaoKe PengMohammad Tehranipoor OriginalPaper 31 January 2013 Pages: 35 - 48
Testing of Synchronizers in Asynchronous FIFO Hyoung-Kook KimLaung-Terng WangWen-Ben Jone OriginalPaper 14 February 2013 Pages: 49 - 72
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints Sobeeh AlmukhaizimSara BunianOzgur Sinanoglu OriginalPaper 27 January 2013 Pages: 73 - 86
SEU Fault-Injection in VHDL-Based Processors: A Case Study Wassim MansourRaoul Velazco OriginalPaper 13 February 2013 Pages: 87 - 94
A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance Han HanHoujun WangNa Zhang OriginalPaper 21 December 2012 Pages: 95 - 102
Eliminating the Timing Penalty of Scan Ozgur SinanogluVishwani D. Agrawal OriginalPaper 23 February 2013 Pages: 103 - 114
Analog Circuits Fault Detection Using Cross-Entropy Approach Xifeng LiYongle Xie OriginalPaper 27 January 2013 Pages: 115 - 120