1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 24 May 2012 Pages: 263 - 264

2. Test Technology Newsletter

   News 04 May 2012 Pages: 265 - 266

   

3. Digital-Compatible Testing Scheme for Operational Amplifier

   • Hsin-Wen Ting

   OriginalPaper 01 April 2012 Pages: 267 - 277

   

4. A New Optimal Test Node Selection Method for Analog Circuit

   • Hui Luo
   • Youren Wang
   • Yuanyuan Jiang

   OriginalPaper 03 January 2012 Pages: 279 - 290

   

5. Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features

   • Bing Long
   • Shulin Tian
   • Houjun Wang

   OriginalPaper 21 January 2012 Pages: 291 - 300

   

6. Iterative Antirandom Testing

   • Ireneusz Mrozek
   • Vyacheslav N. Yarmolik

   OriginalPaper Open access 11 January 2012 Pages: 301 - 315

   

7. Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

   • Renan Alves Fonseca
   • Luigi Dilillo
   • Nabil Badereddine

   OriginalPaper 18 April 2012 Pages: 317 - 329

   

8. Optimization of SEU Simulations for SRAM Cells Reliability under Radiation

   • K. Castellani-Coulié
   • H. Aziza
   • J-M. Portal

   OriginalPaper 14 February 2012 Pages: 331 - 338

   

9. IC Immunity Modeling Process Validation Using On-Chip Measurements

   • S. Ben Dhia
   • A. Boyer
   • M. Deobarro

   OriginalPaper 04 April 2012 Pages: 339 - 348

   

10. NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded Systems

    • Cesare Ferri
    • Dimitra Papagiannopoulou
    • Andrea Calimera

    OriginalPaper 01 April 2012 Pages: 349 - 363

    

11. Challenges for Semiconductor Test Engineering: A Review Paper

    • Stefan R. Vock
    • Omar J. Escalona
    • Frank J. Owens

    OriginalPaper 26 January 2012 Pages: 365 - 374

    

12. Robust Coupling Delay Test Sets

    • Joonhwan Yi
    • John P. Hayes

    OriginalPaper 13 April 2012 Pages: 375 - 388