1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 03 April 2012 Pages: 151 - 152

2. Test Technology Newsletter

   News 10 March 2012 Pages: 153 - 154

   

3. A Modified Simulation-Based Multi-Signal Modeling for Electronic System

   • Chen Xiaomei
   • Meng Xiaofeng
   • Wang Guohua

   OriginalPaper 17 January 2012 Pages: 155 - 165

   

4. Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor

   • R. Ayadi
   • S. Mahresi
   • M. Masmoudi

   OriginalPaper 09 March 2012 Pages: 167 - 176

   

5. Diagnostic Test Set Minimization and Full-Response Fault Dictionary

   • Mohammed Ashfaq Shukoor
   • Vishwani D. Agrawal

   OriginalPaper 14 February 2012 Pages: 177 - 187

   

6. Software-Based Testing for System Peripherals

   • M. Grosso
   • W. J. Perez Holguin
   • J. Velasco Medina

   OriginalPaper 26 February 2012 Pages: 189 - 200

   

7. A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk

   • Junxia Ma
   • Mohammad Tehranipoor
   • Patrick Girard

   OriginalPaper 17 December 2011 Pages: 201 - 214

   

8. Analysis and Fault Modeling of Actual Resistive Defects in ATMEL eFlash Memories

   • P.-D. Mauroux
   • A. Virazel
   • L. Vachez

   OriginalPaper 01 February 2012 Pages: 215 - 228

   

9. Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors

   • C. Thibeault
   • Y. Hariri
   • C. Hobeika

   OriginalPaper 25 December 2011 Pages: 229 - 242

   

10. Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts

    • Yang Zhao
    • Krishnendu Chakrabarty
    • Bhargab B. Bhattacharya

    OriginalPaper 12 November 2011 Pages: 243 - 255

    

11. Fault Detection of Analog Circuits Using Network Parameters

    • A. Kavithamani
    • V. Manikandan
    • N. Devarajan

    Letter 17 February 2012 Pages: 257 - 261