A Modified Simulation-Based Multi-Signal Modeling for Electronic System Chen XiaomeiMeng XiaofengWang Guohua OriginalPaper 17 January 2012 Pages: 155 - 165
Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor R. AyadiS. MahresiM. Masmoudi OriginalPaper 09 March 2012 Pages: 167 - 176
Diagnostic Test Set Minimization and Full-Response Fault Dictionary Mohammed Ashfaq ShukoorVishwani D. Agrawal OriginalPaper 14 February 2012 Pages: 177 - 187
Software-Based Testing for System Peripherals M. GrossoW. J. Perez HolguinJ. Velasco Medina OriginalPaper 26 February 2012 Pages: 189 - 200
A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk Junxia MaMohammad TehranipoorPatrick Girard OriginalPaper 17 December 2011 Pages: 201 - 214
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL eFlash Memories P.-D. MaurouxA. VirazelL. Vachez OriginalPaper 01 February 2012 Pages: 215 - 228
Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors C. ThibeaultY. HaririC. Hobeika OriginalPaper 25 December 2011 Pages: 229 - 242
Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts Yang ZhaoKrishnendu ChakrabartyBhargab B. Bhattacharya OriginalPaper 12 November 2011 Pages: 243 - 255
Fault Detection of Analog Circuits Using Network Parameters A. KavithamaniV. ManikandanN. Devarajan Letter 17 February 2012 Pages: 257 - 261