1. Editorial

   • Vishwani D. Agrawal

   OriginalPaper 11 November 2011 Pages: 681 - 682

   

2. Test Technology Newsletter

   Events 27 October 2011 Pages: 683 - 684

   

3. Band-Pass Filter Design with Diagnosis Facilities Based on Predictive Techniques

   • Joan Font-Rosselló
   • Eugeni Isern
   • Eugenio García-Moreno

   OriginalPaper 18 October 2011 Pages: 685 - 696

   

4. Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs

   • Jin-Fu Lin
   • Hsin-Wen Ting

   OriginalPaper 09 September 2011 Pages: 697 - 709

   

5. Calibrating On-chip Thermal Sensors in Integrated Circuits: A Design-for-Calibration Approach

   • Chunhua Yao
   • Kewal K. Saluja
   • Parmesh Ramanathan

   OriginalPaper 21 September 2011 Pages: 711 - 721

   

6. Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear Programming

   • Chen-Yuan Kao
   • Chien-Hui Liao
   • Charles H.-P. Wen

   OriginalPaper 22 October 2011 Pages: 723 - 739

   

7. Computing the Detection Probability for Small Delay Defects of Nanometer ICs

   • José L. García-Gervacio
   • Victor Champac

   OriginalPaper 26 October 2011 Pages: 741 - 752

   

8. Symmetry Measure for Memory Test and Its Application in BIST Optimization

   • Gurgen Harutyunyan
   • Aram Hakhumyan
   • Yervant Zorian

   OriginalPaper 09 September 2011 Pages: 753 - 766

   

9. Security Against Hardware Trojan Attacks Using Key-Based Design Obfuscation

   • Rajat Subhra Chakraborty
   • Swarup Bhunia

   OriginalPaper 15 October 2011 Pages: 767 - 785

   

10. An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture

    • Min-yong Wan
    • Yong Ding
    • Xiao-lang Yan

    OriginalPaper 13 October 2011 Pages: 787 - 796