Experimental Results for Slow-speed Timing Characterization of High-speed Pipelined Datapaths Muhammad NummerManoj Sachdev OriginalPaper 03 November 2010 Pages: 9 - 17
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment Vezio MalandruccoloMauro CiappaWolfgang Fichtner OriginalPaper 03 November 2010 Pages: 19 - 30
Masking of X-Values by Use of a Hierarchically Configurable Register Thomas RabenaltMichael GoesselAndreas Leininger OriginalPaper 17 November 2010 Pages: 31 - 41
Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping Bin ZhouLi-yi XiaoXin-Chun Wu OriginalPaper 04 November 2010 Pages: 43 - 56
Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems Qais Al-GayemHongyuan LiuNick Burd OriginalPaper 05 November 2010 Pages: 57 - 68
Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates Yang ZhaoKrishnendu Chakrabarty OriginalPaper 15 December 2010 Pages: 69 - 83
A Design of Linearity Built-in Self-Test for Current-Steering DAC Hsin-Wen TingSoon-Jyh ChangSu-Ling Huang OriginalPaper 04 November 2010 Pages: 85 - 94