1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 16 July 2010 Pages: 401 - 401

2. Test Technology Newsletter

   News 06 July 2010 Pages: 403 - 404

3. Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices

   • Ganesh Srinivasan
   • Abhijit Chatterjee
   • Pramod Variyam

   OriginalPaper 05 August 2010 Pages: 405 - 417

   

4. Test Generation Algorithm for Linear Systems Based on Genetic Algorithm

   • Ting Long
   • Houjun Wang
   • Bing Long

   OriginalPaper 08 June 2010 Pages: 419 - 428

   

5. A BIST Solution for Frequency Domain Characterization of Analog Circuits

   • Manuel J. Barragán
   • Diego Vázquez
   • Adoración Rueda

   OriginalPaper 21 May 2010 Pages: 429 - 441

   

6. A New Built-in TPG Based on Berlekamp–Massey Algorithm

   • Cleonilson Protásio de Souza
   • Francisco Marcos de Assis
   • Raimundo Carlos Silvério Freire

   OriginalPaper 05 May 2010 Pages: 443 - 451

   

7. Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism

   • Ardy van den Berg
   • Pengwei Ren
   • Kees Goossens

   OriginalPaper Open access 10 July 2010 Pages: 453 - 464

   

8. On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power

   • Sobeeh Almukhaizim
   • Shouq Alsubaihi
   • Ozgur Sinanoglu

   OriginalPaper 04 June 2010 Pages: 465 - 481

   

9. On the Duality of Probing and Fault Attacks

   • Berndt M. Gammel
   • Stefan Mangard

   OriginalPaper 29 May 2010 Pages: 483 - 493