1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 20 May 2010 Pages: 293 - 293

2. Test Technology Newsletter

   News 09 May 2010 Pages: 295 - 296

3. Using Evolutionary Algorithms for Signal Integrity Assessment of High-Speed Data Buses

   • Maynard Falconer
   • Garrison Greenwood
   • Konika Ganguly

   OriginalPaper 05 February 2010 Pages: 297 - 305

   

4. MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics

   • Stephan Eggersglüß
   • Görschwin Fey
   • Rolf Drechsler

   OriginalPaper 20 February 2010 Pages: 307 - 322

   

5. False Error Vulnerability Study of On-line Soft Error Detection Mechanisms

   • Kiran Kumar Reddy
   • Bharadwaj S. Amrutur
   • Rubin A. Parekhji

   OriginalPaper 15 April 2010 Pages: 323 - 335

   

6. One-to-Many: Context-Oriented Code for Concurrent Error Detection

   • Osnat Keren

   OriginalPaper 09 January 2010 Pages: 337 - 353

   

7. Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors

   • Luca Testa
   • Hervé Lapuyade
   • Jean-Baptiste Bégueret

   OriginalPaper 13 April 2010 Pages: 355 - 365

   

8. Fault Modeling and Analysis for Resistive Bridging Defects in a Synchronizer

   • Hyoung-Kook Kim
   • Wen-Ben Jone
   • Laung-Terng Wang

   OriginalPaper 09 March 2010 Pages: 367 - 392

   

9. Test Data Compression Using Multi-dimensional Pattern Run-length Codes

   • Wang-Dauh Tseng
   • Lung-Jen Lee

   OriginalPaper 27 January 2010 Pages: 393 - 400