1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 15 August 2009 Pages: 209 - 209

2. Test Technology Newsletter

   News 12 August 2009 Pages: 211 - 212

   

3. Critical Path Selection for Delay Testing Considering Coupling Noise

   • Rajeshwary Tayade
   • Jacob A. Abraham

   OriginalPaper 16 July 2009 Pages: 213 - 223

   

4. Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard

   • Mehran Mozaffari-Kermani
   • Arash Reyhani-Masoleh

   OriginalPaper 17 July 2009 Pages: 225 - 245

   

5. X-tolerant Test Data Compaction with Accelerated Shift Registers

   • Martin Hilscher
   • Michael Braun
   • Michael Gössel

   OriginalPaper 27 June 2009 Pages: 247 - 258

   

6. Adaptive Debug and Diagnosis Without Fault Dictionaries

   • Stefan Holst
   • Hans-Joachim Wunderlich

   OriginalPaper 29 July 2009 Pages: 259 - 268

   

7. A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard

   • G. Di Natale
   • M. Doulcier
   • B. Rouzeyre

   OriginalPaper 30 June 2009 Pages: 269 - 278

   

8. A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range

   • R. Fernández

   Letter 18 June 2009 Pages: 279 - 283