1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 17 May 2008 Pages: 321 - 321

2. Test Technology Newsletter August 2008

   News 23 May 2008 Pages: 323 - 324

3. Guest Editorial

   • Nicola Nicolici
   • Patrick Girard

   EditorialNotes 31 January 2008 Pages: 325 - 326

4. Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells

   • Xijiang Lin
   • Yu Huang

   OriginalPaper 22 January 2008 Pages: 327 - 334

   

5. Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial Transformations

   • Ozgur Sinanoglu

   OriginalPaper 10 January 2008 Pages: 335 - 351

   

6. A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction

   • N. Badereddine
   • Z. Wang
   • C. Landrault

   OriginalPaper 17 January 2008 Pages: 353 - 364

   

7. A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment

   • Hong-Sik Kim
   • Sungho Kang
   • Michael S. Hsiao

   OriginalPaper 18 January 2008 Pages: 365 - 378

   

8. Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing

   • Xiaoqing Wen
   • Kohei Miyase
   • Kozo Kinoshita

   OriginalPaper 16 January 2008 Pages: 379 - 391

   

9. Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy

   • Ho Fai Ko
   • Nicola Nicolici

   OriginalPaper 17 January 2008 Pages: 393 - 403

   

10. On Composite Leakage Current Maximization

    • Ashesh Rastogi
    • Kunal P. Ganeshpure
    • Sandip Kundu

    OriginalPaper 19 February 2008 Pages: 405 - 420