1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 27 March 2007 Pages: 111 - 111

2. Test Technology Newsletter April 2007

   • Bruce Kim

   News 27 March 2007 Pages: 113 - 114

3. Guest Editorial

   • Mohammad Tehranipoor

   EditorialNotes 20 March 2007 Pages: 115 - 116

4. Defect-tolerant Logic with Nanoscale Crossbar Circuits

   • Tad Hogg
   • Greg Snider

   OriginalPaper 21 March 2007 Pages: 117 - 129

5. A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology

   • Jason G. Brown
   • R. D. Blanton

   OriginalPaper 20 April 2007 Pages: 131 - 144

6. Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics

   • Zhanglei Wang
   • Krishnendu Chakrabarty

   OriginalPaper 20 April 2007 Pages: 145 - 161

7. On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire

   • Jing Huang
   • Mariam Momenzadeh
   • Fabrizio Lombardi

   OriginalPaper 20 March 2007 Pages: 163 - 174

8. Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems

   • Jia Di
   • Parag K. Lala

   OriginalPaper 20 April 2007 Pages: 175 - 192

9. QCA Circuits for Robust Coplanar Crossing

   • Sanjukta Bhanja
   • Marco Ottavi
   • Salvatore Pontarelli

   OriginalPaper 22 March 2007 Pages: 193 - 210

10. Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata

    • Mo Liu
    • Craig S. Lent

    OriginalPaper 20 March 2007 Pages: 211 - 218

11. Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips

    • Fei Su
    • William Hwang
    • Krishnendu Chakrabarty

    OriginalPaper 21 March 2007 Pages: 219 - 233

12. Towards Nanoelectronics Processor Architectures

    • Wenjing Rao
    • Alex Orailoglu
    • Ramesh Karri

    OriginalPaper 20 March 2007 Pages: 235 - 254

13. Designing Nanoscale Logic Circuits Based on Markov Random Fields

    • K. Nepal
    • R. I. Bahar
    • A. Zaslavsky

    OriginalPaper 22 March 2007 Pages: 255 - 266