1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes 06 February 2007 Pages: 5 - 5

2. New Editor

   EditorialNotes 06 February 2007 Pages: 7 - 7

3. Test Technology Newsletter

   • Bruce C. Kim

   EditorialNotes 06 February 2007 Pages: 9 - 10

4. Improve the Quality of Per-Test Fault Diagnosis Using Output Information

   • Chunsheng Liu

   OriginalPaper 02 February 2007 Pages: 11 - 24

5. Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults

   • Uğur Çilingiroğlu

   OriginalPaper 01 February 2007 Pages: 25 - 34

6. Isolation of Failing Scan Cells through Convolutional Test Response Compaction

   • Grzegorz Mrugalski
   • Janusz Rajski
   • Jerzy Tyszer

   OriginalPaper 06 February 2007 Pages: 35 - 45

7. Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAs

   • L. Sterpone
   • M. Sonza Reorda
   • L. Carro

   OriginalPaper 24 January 2007 Pages: 47 - 54

8. Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

   • G. Harutunyan
   • V. A. Vardanian
   • Y. Zorian

   OriginalPaper 06 February 2007 Pages: 55 - 74

9. Generation of Primary Input Blocking Pattern for Power Minimization during Scan Testing

   • Wang-Dauh Tseng

   OriginalPaper 24 January 2007 Pages: 75 - 84

10. RF Testing on a Mixed Signal Tester

    • Dana Brown
    • John Ferrario
    • Mustapha Slamani

    OriginalPaper 06 February 2007 Pages: 85 - 94

11. A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters

    • Shalabh Goyal
    • Abhijit Chatterjee
    • Michael Purtell

    OriginalPaper 15 January 2007 Pages: 95 - 106