1. Editorial

   • Vishwani D. Agrawal

   EditorialNotes Pages: 111 - 111

2. Test Technology Technical Council Newsletter

   • B. Kim

   News Pages: 113 - 114

3. Error Diagnosis of Sequential Circuits Using Region-Based Model

   • Anand L. D’Souza
   • Michael S. Hsiao

   OriginalPaper Pages: 115 - 126

4. An Analog Circuit Fault Characterization Methodology

   • Yvan Maidon
   • Thomas Zimmer
   • André Ivanov

   OriginalPaper Pages: 127 - 134

5. Applying the Oscillation Test Strategy to FPAA’s Configurable Analog Blocks

   • Tiago R. Balen
   • Antonio Q. Andrade Jr.
   • Michel Renovell

   OriginalPaper Pages: 135 - 146

6. Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current

   • Swarup Bhunia
   • Arijit Raychowdhury
   • Kaushik Roy

   OriginalPaper Pages: 147 - 159

7. Phase Shifter Merging

   • Dimitri Kagaris

   OriginalPaper Pages: 161 - 168

8. Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

   • Simone Borri
   • Magali Hage-Hassan
   • Arnaud Virazel

   OriginalPaper Pages: 169 - 179

9. Selection of Crosstalk-Induced Faults in Enhanced Delay Test

   • Huawei Li
   • Xiaowei Li

   OriginalPaper Pages: 181 - 195