Error Diagnosis of Sequential Circuits Using Region-Based Model Anand L. D’SouzaMichael S. Hsiao OriginalPaper Pages: 115 - 126
An Analog Circuit Fault Characterization Methodology Yvan MaidonThomas ZimmerAndré Ivanov OriginalPaper Pages: 127 - 134
Applying the Oscillation Test Strategy to FPAA’s Configurable Analog Blocks Tiago R. BalenAntonio Q. Andrade Jr.Michel Renovell OriginalPaper Pages: 135 - 146
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current Swarup BhuniaArijit RaychowdhuryKaushik Roy OriginalPaper Pages: 147 - 159
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test Simone BorriMagali Hage-HassanArnaud Virazel OriginalPaper Pages: 169 - 179
Selection of Crosstalk-Induced Faults in Enhanced Delay Test Huawei LiXiaowei Li OriginalPaper Pages: 181 - 195