1. Editorial

   EditorialNotes Pages: 133 - 133

2. On behavior fault modeling for digital designs

   • Sumit Ghosh
   • Tapan J. Chakraborty

   OriginalPaper Pages: 135 - 151

3. Cyclic code weight spectra and BIST aliasing

   • Geetani Edirisooriya
   • John P. Robinson

   OriginalPaper Pages: 153 - 163

4. BIDES: A BIST design expert system

   • Kwanghyun Kim
   • Joseph G. Tront
   • Dong S. Ha

   OriginalPaper Pages: 165 - 179

5. Fault simulation for general FCMOS ICs

   • M. Favalli
   • P. Olivo
   • F. Somenzi

   OriginalPaper Pages: 181 - 190

6. Fault simulation using small fault samples

   • Wilfried Daehn

   OriginalPaper Pages: 191 - 203

7. Self-checking CMOS circuits using pass-transistor logic

   • Kanji Hirabayashi

   OriginalPaper Pages: 205 - 208

8. Erratum

   Erratum Pages: 209 - 209