IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status R. G. BennettsA. Osseyran OriginalPaper Pages: 11 - 25
An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1 C. M. MaunderR. E. Tulloss OriginalPaper Pages: 27 - 42
A language for describing boundary scan devices Kenneth P. ParkerStig Oresjo OriginalPaper Pages: 43 - 75
Boundary scan test, test methodology, and fault modeling Frans De JongJosé S. MatosJosé M. Ferreira OriginalPaper Pages: 77 - 88
ATPG and diagnostics for boards implementing boundary scan Don SterbaAndy HallidayDon McClean OriginalPaper Pages: 89 - 98
Scan test architectures for digital board testers Matthew L. FichtenbaumGordon D. Robinson OriginalPaper Pages: 99 - 105
Features of a Scan and Clock Resource chip for providing access to board-level test functions Bulent I. Dervisoglu OriginalPaper Pages: 107 - 115
An optimal scheduling algorithm for testing interconnect using boundary scan Jung-Cheun LienMelvin A. Breuer OriginalPaper Pages: 117 - 130